Matexcel Microscopy Reference Standard 849 ASS-849

Description
Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated).) Mounting: Hitachi Pin-Mounted
Datasheet
Description
Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated).) Mounting: Hitachi Pin-Mounted
Datasheet

Suppliers

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Microscopy Reference Standard 849 - ASS-849 - Matexcel
Shirley, NY, United States
Microscopy Reference Standard 849
ASS-849
Microscopy Reference Standard 849 ASS-849
Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated).) Mounting: Hitachi Pin-Mounted

Pitch: 292 nm
Surface feature: Titanium lines
Substrate: Silicon (3 x 4mm.
Line height: approximately 30 nm (not calibrated).
Line width: Approximately 130 nm (not calibrated).)
Mounting: Hitachi Pin-Mounted

Supplier's Site Datasheet

Technical Specifications

  Matexcel
Product Category Microscopy and Metallography Sample Preparation Equipment
Product Number ASS-849
Product Name Microscopy Reference Standard 849
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