Matexcel Microscopy Reference Standard 834 ASS-834

Description
Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted 4x3 mm die. Bump height (about 100 nm) is not calibrated.
  • Microscopy Reference Standard 834 - ASS-834 - Matexcel
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Datasheet
Description
Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted 4x3 mm die. Bump height (about 100 nm) is not calibrated.
Datasheet

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Microscopy Reference Standard 834 - ASS-834 - Matexcel
Matexcel
Shirley, NY, United States
Microscopy Reference Standard 834
ASS-834
Microscopy Reference Standard 834 ASS-834
Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted 4x3 mm die. Bump height (about 100 nm) is not calibrated.

Pitch: 297 nm
Surface feature: Aluminum bumps
Substrate: Silicon
Mounting: Mounted 4x3 mm die. Bump height (about 100 nm) is not calibrated.

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Technical Specifications

  Matexcel
Product Category Microscopy and Metallography Sample Preparation Equipment
Product Number ASS-834
Product Name Microscopy Reference Standard 834
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