Matexcel Microscopy Reference Standard 833 ASS-833

Description
Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 100 nm) is not calibrated.) Mounting: Unmounted
  • Microscopy Reference Standard 833 - ASS-833 - Matexcel
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Datasheet
Description
Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 100 nm) is not calibrated.) Mounting: Unmounted
Datasheet

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Microscopy Reference Standard 833 - ASS-833 - Matexcel
Matexcel
Shirley, NY, United States
Microscopy Reference Standard 833
ASS-833
Microscopy Reference Standard 833 ASS-833
Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 100 nm) is not calibrated.) Mounting: Unmounted

Pitch: 297 nm
Surface feature: Aluminum bumps
Substrate: Silicon (4x3 mm die. Bump height (about 100 nm) is not calibrated.)
Mounting: Unmounted

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Technical Specifications

  Matexcel
Product Category Microscopy and Metallography Sample Preparation Equipment
Product Number ASS-833
Product Name Microscopy Reference Standard 833
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