Matexcel Microscopy Reference Standard 831 AFM-831

Description
Pitch: 145nm Surface feature: Aluminum lines Substrate: Glass (4x6 mm. Line height (about 100 nm) and line width (about 75 nm) are not calibrated.) Mounting: Unmounted
Datasheet
Description
Pitch: 145nm Surface feature: Aluminum lines Substrate: Glass (4x6 mm. Line height (about 100 nm) and line width (about 75 nm) are not calibrated.) Mounting: Unmounted
Datasheet

Suppliers

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Product
Description
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Microscopy Reference Standard 831 - AFM-831 - Matexcel
Shirley, NY, United States
Microscopy Reference Standard 831
AFM-831
Microscopy Reference Standard 831 AFM-831
Pitch: 145nm Surface feature: Aluminum lines Substrate: Glass (4x6 mm. Line height (about 100 nm) and line width (about 75 nm) are not calibrated.) Mounting: Unmounted

Pitch: 145nm
Surface feature: Aluminum lines
Substrate: Glass (4x6 mm. Line height (about 100 nm) and line width (about 75 nm) are not calibrated.)
Mounting: Unmounted

Supplier's Site Datasheet

Technical Specifications

  Matexcel
Product Category Microscopy and Metallography Sample Preparation Equipment
Product Number AFM-831
Product Name Microscopy Reference Standard 831
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