KPM Analytics High-Performance Extended Range NIR Analyzer SpectraStar™ XT-F

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High-Performance Extended Range NIR Analyzer - SpectraStar™ XT-F - KPM Analytics
Westborough, MA, United States
High-Performance Extended Range NIR Analyzer SpectraStar™ XT-F
Product Overview Complete Package for Accurate Analysis of Flour, Wheat, and By-Products Designed for the milling and baking industries, the SpectraStar™ XT-F is the complete analyzer package for accurate analysis of flour, wheat, and by-products at-line or in a lab setting in under one minute. With a sealed case and touch screen operation, the SpectraStar™ XT-F is a ready-to-use solution for millers and bakers to test incoming wheat quality, monitor tempering processes, evaluating process streams to ensure optimal milling conditions, qualify raw ingredients, and more. Advantages for Millers: Rapid analysis of incoming and tempered wheat ensures grain is of the expected grade In-process testing of milling streams increases flour yield and provides accurate data to optimize blends for grade specifications Finished product testing ensures compliance with end-user requirements Advantages for Bakers: Test incoming and in-process raw ingredients for both compositional and functional properties (water absorption, starch damage, and rheological properties) Ensure consistent composition and quality, leading to fewer production issues and higher quality final products All SpectraStar™ XT analyzers are operated by UScan™, a software package incorporating an intuitive graphical interface and a reliable SQL database for data management. Designed for ease of use, routine operators can be completely trained in 15 minutes to deliver accurate, operator-independent results. The SpectraStar™ XT patented TRUE ALIGNMENT® Spectroscopy (TAS) is an easy-to-use technology to precisely align and monitor the instrument calibration to certified optical standards for reliable results over time and across analyzers. Features Access an extensive library of robust calibrations developed from hundreds-to-thousand s of samples to validate incoming ingredients or grab-samples for important quality parameters Stand-alone design with built-in computer for easy implementation Sealed case for use at-line in production environments Designed for ease-of-use; only minimal training required for routine operators Advanced sample management and reporting features makes the analyzer lab-ready Sealed case with 17” touch screen monitor for easy operation in laboratories or at-line on the production floor Windows®10 Professional computer with SSD provides easy integration into computer networks Benefits Obtain vital quality parameter data in about 30 seconds, enabling quick response for quality control Analyze fibers, sugars, fatty acids, starch, and other difficult constituents, as well as moisture, protein, and ash Easy-to-use with graphical interface and modular configuration, requiring minimal training for routine operators Minimal sample preparation required Environmentally friendly; requires minimal energy use with no hazardous chemicals or waste Save costs and reduce waste, which improves your company’s bottom line
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Technical Specifications

  KPM Analytics
Product Category Infrared Spectrometers
Product Number SpectraStar™ XT-F
Product Name High-Performance Extended Range NIR Analyzer
Operating Temperature 32 to 104 F (0.0 to 40 C)
IR Range Near
User Interface Digital Front Panel
Spectral Range: 1400 to 2600 nm (14000 to 26000 Å)
Remote Interface Serial
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