Features
Non-contact 3D metrology system performs nanometer level profile, roughness and thickness measurements on nearly any material.
This software module complies with ISO 25178 and allows users to complete measurements of several surface parameters.
Up to 28,800x magnification
0.5 nanometer Z-axis resolution on almost any material
High-resolution, large depth-of-field observation
Profile and roughness measurements with zero sample preparation
Measures thickness and uniformity of clear layers
No data loss - even on steep angles
Perform measurements with just a single click
Features
Non-contact 3D metrology system performs nanometer level profile, roughness and thickness measurements on nearly any material.
- This software module complies with ISO 25178 and allows users to complete measurements of several surface parameters.
- Up to 28,800x magnification
- 0.5 nanometer Z-axis resolution on almost any material
- High-resolution, large depth-of-field observation
- Profile and roughness measurements with zero sample preparation
- Measures thickness and uniformity of clear layers
- No data loss - even on steep angles
- Perform measurements with just a single click
