Infineon Technologies AG Memory S29GL128S10TFV013

Description
FLASH - NOR Memory IC 128Mb (8M x 16) Parallel 100ns 56-TSOP
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Description
FLASH - NOR Memory IC 128Mb (8M x 16) Parallel 100ns 56-TSOP
Request a Quote
Datasheet
Datasheet Summary
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The S29GL128S10TFV013 is a 128 Mb NOR Flash memory device from Quarktwin Technology Ltd., utilizing MIRRORBIT,Ñ¢ Eclipse technology and fabricated on a 65-nm process. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range from 1.65 V to V_CC. The device supports a vó16 data bus and offers fast access times, with a maximum random access time of 90 ns and a page access time as low as 15 ns. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 512 bytes in a single operation. It supports automatic error checking and correction (ECC) with single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and advanced sector protection methods. The S29GL128S10TFV013 is rated for 100,000 program/erase cycles and has a data retention period of 20 years. The device is available in various packaging options, including a 56-pin TSOP and multiple BGA configurations. It is suitable for industrial applications with operating temperature ranges from -40¬8C to +85¬8C and automotive applications with AEC-Q100 grade options. This product is designed for embedded applications requiring high density, performance, and low power consumption.

Datasheet Summary
Powered by GS/AI

The S29GL128S10TFV013 is a 128 Mb NOR Flash memory device from Quarktwin Technology Ltd., utilizing MIRRORBIT,Ñ¢ Eclipse technology and fabricated on a 65-nm process. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range from 1.65 V to V_CC. The device supports a vó16 data bus and offers fast access times, with a maximum random access time of 90 ns and a page access time as low as 15 ns. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 512 bytes in a single operation. It supports automatic error checking and correction (ECC) with single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and advanced sector protection methods. The S29GL128S10TFV013 is rated for 100,000 program/erase cycles and has a data retention period of 20 years. The device is available in various packaging options, including a 56-pin TSOP and multiple BGA configurations. It is suitable for industrial applications with operating temperature ranges from -40¬8C to +85¬8C and automotive applications with AEC-Q100 grade options. This product is designed for embedded applications requiring high density, performance, and low power consumption.

Suppliers

Company
Product
Description
Supplier Links
Memory - 448-S29GL128S10TFV013TR-ND - DigiKey
Thief River Falls, MN, United States
FLASH - NOR Memory IC 128Mb (8M x 16) Parallel 100ns 56-TSOP

FLASH - NOR Memory IC 128Mb (8M x 16) Parallel 100ns 56-TSOP

Buy Now Datasheet
Memory - S29GL128S10TFV013 - Quarktwin Technology Ltd.
Shenzhen, Guangdong, China
FLASH - NOR Memory IC 128Mbit Parallel 100 ns 56-TSOP

FLASH - NOR Memory IC 128Mbit Parallel 100 ns 56-TSOP

Buy Now Datasheet
IC FLASH 128MBIT PARALLEL 56TSOP

IC FLASH 128MBIT PARALLEL 56TSOP

Supplier's Site Datasheet

Technical Specifications

  DigiKey Quarktwin Technology Ltd. Lingto Electronic Limited
Product Category Memory Chips Memory Chips Memory Chips
Product Number 448-S29GL128S10TFV013TR-ND S29GL128S10TFV013 S29GL128S10TFV013
Product Name Memory Memory Memory
Memory Category Flash Flash; FLASH Flash; Flash
Operating Temperature -40 to 105 C (-40 to 221 F) -40 to 105 C (-40 to 221 F)
Density 128000 kbits 128000 kbits 128000 kbits
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