Infineon Technologies AG Memory IS29GL01GS-11TFV02-TR

Description
FLASH - NOR Memory IC 1Gbit Parallel 110 ns 56-TSOP
Description
FLASH - NOR Memory IC 1Gbit Parallel 110 ns 56-TSOP
Datasheet
Datasheet Summary
Powered by GS/AI

The IS29GL01GS-11TFV02-TR is a 1 Gb NOR Flash memory device from Quarktwin Technology Ltd., utilizing 65-nm MIRRORBIT,Ñ¢ Eclipse technology. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range from 1.65 V to V_CC. The device supports a vó16 data bus and offers fast access times, with a page access time as low as 15 ns and random access time of 90 ns. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 512 bytes in a single operation. It supports automatic error checking and correction (ECC) with single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and advanced sector protection methods. The IS29GL01GS-11TFV02-TR is rated for 100,000 program/erase cycles and has a data retention period of 20 years. The product is available in multiple packaging options, including a 56-pin TSOP and various BGA configurations. It is suitable for industrial applications with operating temperature grades ranging from -40¬8C to +105¬8C, making it a robust choice for embedded systems requiring high density and performance.

Datasheet Summary
Powered by GS/AI

The IS29GL01GS-11TFV02-TR is a 1 Gb NOR Flash memory device from Quarktwin Technology Ltd., utilizing 65-nm MIRRORBIT,Ñ¢ Eclipse technology. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range from 1.65 V to V_CC. The device supports a vó16 data bus and offers fast access times, with a page access time as low as 15 ns and random access time of 90 ns. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 512 bytes in a single operation. It supports automatic error checking and correction (ECC) with single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and advanced sector protection methods. The IS29GL01GS-11TFV02-TR is rated for 100,000 program/erase cycles and has a data retention period of 20 years. The product is available in multiple packaging options, including a 56-pin TSOP and various BGA configurations. It is suitable for industrial applications with operating temperature grades ranging from -40¬8C to +105¬8C, making it a robust choice for embedded systems requiring high density and performance.

Suppliers

Company
Product
Description
Supplier Links
FLASH - NOR Memory IC 1Gbit Parallel 110 ns 56-TSOP

FLASH - NOR Memory IC 1Gbit Parallel 110 ns 56-TSOP

Buy Now Datasheet
IC FLASH 1GBIT PARALLEL 56TSOP

IC FLASH 1GBIT PARALLEL 56TSOP

Supplier's Site Datasheet

Technical Specifications

  Quarktwin Technology Ltd. Lingto Electronic Limited
Product Category Memory Chips Memory Chips
Product Number IS29GL01GS-11TFV02-TR IS29GL01GS-11TFV02-TR
Product Name Memory Memory
Memory Category Flash; FLASH Flash; Flash
Access Time 110 ns 110 ns
Operating Temperature -40 to 85 C (-40 to 185 F)
Unlock Full Specs
to access all available technical data

Similar Products

 - 27S181PC - Rochester Electronics
Specs
Memory Category PROM
Package Type DIP; PDIP24
View Details
4 suppliers
Memory - MYXxxSMS04GP32xxx-45/x - Micross Components, Inc.
Micross Components, Inc.
Specs
Memory Category MRAM; STT-MRAM
Access Time 45 ns
Operating Temperature -55 to 125 C (-67 to 257 F)
View Details
Memory - 448-S25FL064LABMFV013TR-ND - DigiKey
Infineon Technologies AG
Specs
Memory Category Flash
Operating Temperature -40 to 105 C (-40 to 221 F)
Density 64000 kbits
View Details
7 suppliers
 - LP3913SQ-AU/NOPB - Rochester Electronics
Texas Instruments
Specs
Memory Category Flash
Package Type HVQFN48
View Details