Infineon Technologies AG Memory IS29GL01GS-11TFV02-TR

Description
FLASH - NOR Memory IC 1Gbit Parallel 110 ns 56-TSOP
Description
FLASH - NOR Memory IC 1Gbit Parallel 110 ns 56-TSOP
Datasheet
Datasheet Summary
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The IS29GL01GS-11TFV02-TR is a 1 Gb NOR Flash memory device from Quarktwin Technology Ltd., utilizing 65-nm MIRRORBIT,Ñ¢ Eclipse technology. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range from 1.65 V to V_CC. The device supports a vó16 data bus and offers fast access times, with a page access time as low as 15 ns and random access time of 90 ns. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 512 bytes in a single operation. It supports automatic error checking and correction (ECC) with single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and advanced sector protection methods. The IS29GL01GS-11TFV02-TR is rated for 100,000 program/erase cycles and has a data retention period of 20 years. The product is available in multiple packaging options, including a 56-pin TSOP and various BGA configurations. It is suitable for industrial applications with operating temperature grades ranging from -40¬8C to +105¬8C, making it a robust choice for embedded systems requiring high density and performance.

Datasheet Summary
Powered by GS/AI

The IS29GL01GS-11TFV02-TR is a 1 Gb NOR Flash memory device from Quarktwin Technology Ltd., utilizing 65-nm MIRRORBIT,Ñ¢ Eclipse technology. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range from 1.65 V to V_CC. The device supports a vó16 data bus and offers fast access times, with a page access time as low as 15 ns and random access time of 90 ns. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 512 bytes in a single operation. It supports automatic error checking and correction (ECC) with single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and advanced sector protection methods. The IS29GL01GS-11TFV02-TR is rated for 100,000 program/erase cycles and has a data retention period of 20 years. The product is available in multiple packaging options, including a 56-pin TSOP and various BGA configurations. It is suitable for industrial applications with operating temperature grades ranging from -40¬8C to +105¬8C, making it a robust choice for embedded systems requiring high density and performance.

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FLASH - NOR Memory IC 1Gbit Parallel 110 ns 56-TSOP

FLASH - NOR Memory IC 1Gbit Parallel 110 ns 56-TSOP

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IC FLASH 1GBIT PARALLEL 56TSOP

IC FLASH 1GBIT PARALLEL 56TSOP

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Technical Specifications

  Quarktwin Technology Ltd. Lingto Electronic Limited
Product Category Memory Chips Memory Chips
Product Number IS29GL01GS-11TFV02-TR IS29GL01GS-11TFV02-TR
Product Name Memory Memory
Memory Category Flash; FLASH Flash; Flash
Access Time 110 ns 110 ns
Operating Temperature -40 to 85 C (-40 to 185 F)
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