Accuris Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing JIS C 5630-3

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Semiconductor devices - Micro-electromechani cal devices - Part 3: Thin film standard test piece for tensile testing
  • Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing - JIS C 5630-3 - Accuris
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Description
Semiconductor devices - Micro-electromechani cal devices - Part 3: Thin film standard test piece for tensile testing
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Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing - JIS C 5630-3 - Accuris
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Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
JIS C 5630-3
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing JIS C 5630-3
Semiconductor devices - Micro-electromechani cal devices - Part 3: Thin film standard test piece for tensile testing

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

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Technical Specifications

  Accuris
Product Category Standards and Technical Documents
Product Number JIS C 5630-3
Product Name Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
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