Accuris STANDARD TEST METHOD FOR SEPARATING A TOTAL-DOSE- INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD TECHNIQUE F996

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STANDARD TEST METHOD FOR SEPARATING A TOTAL-DOSE- INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD TECHNIQUE

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STANDARD TEST METHOD FOR SEPARATING A TOTAL-DOSE- INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD TECHNIQUE

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STANDARD TEST METHOD FOR SEPARATING A TOTAL-DOSE- INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD TECHNIQUE - F996 - Accuris

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STANDARD TEST METHOD FOR SEPARATING A TOTAL-DOSE- INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD TECHNIQUE
F996

STANDARD TEST METHOD FOR SEPARATING A TOTAL-DOSE- INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD TECHNIQUE F996

STANDARD TEST METHOD FOR SEPARATING A TOTAL-DOSE- INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD TECHNIQUE

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	Accuris
Product Category	Standards and Technical Documents
Product Number	F996
Product Name	STANDARD TEST METHOD FOR SEPARATING A TOTAL-DOSE- INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD TECHNIQUE