Accuris STANDARD TEST METHOD FOR SEPARATING AN IONIZING RADIATION-INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD CURRENT-VOLTA... F996 + REDLINE

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STANDARD TEST METHOD FOR SEPARATING AN IONIZING RADIATION-INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD CURRENT-VOLTAGE CHARACTERISTICS - INCLUDES STANDARD + REDLINE (PDF)
  • STANDARD TEST METHOD FOR SEPARATING AN IONIZING RADIATION-INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD CURRENT-VOLTA... - F996 + REDLINE - Accuris
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STANDARD TEST METHOD FOR SEPARATING AN IONIZING RADIATION-INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD CURRENT-VOLTAGE CHARACTERISTICS - INCLUDES STANDARD + REDLINE (PDF)
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STANDARD TEST METHOD FOR SEPARATING AN IONIZING RADIATION-INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD CURRENT-VOLTA... - F996 + REDLINE - Accuris
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STANDARD TEST METHOD FOR SEPARATING AN IONIZING RADIATION-INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD CURRENT-VOLTA...
F996 + REDLINE
STANDARD TEST METHOD FOR SEPARATING AN IONIZING RADIATION-INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD CURRENT-VOLTA... F996 + REDLINE
STANDARD TEST METHOD FOR SEPARATING AN IONIZING RADIATION-INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD CURRENT-VOLTAGE CHARACTERISTICS - INCLUDES STANDARD + REDLINE (PDF)

STANDARD TEST METHOD FOR SEPARATING AN IONIZING RADIATION-INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD CURRENT-VOLTAGE CHARACTERISTICS - INCLUDES STANDARD + REDLINE (PDF)

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  Accuris
Product Category Standards and Technical Documents
Product Number F996 + REDLINE
Product Name STANDARD TEST METHOD FOR SEPARATING AN IONIZING RADIATION-INDUCED MOSFET THRESHOLD VOLTAGE SHIFT INTO COMPONENTS DUE TO OXIDE TRAPPED HOLES AND INTERFACE STATES USING THE SUBTHRESHOLD CURRENT-VOLTA...
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