Accuris Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Intergrated Circuits (Metric) F744M

Description
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Intergrated Circuits (Metric)
  • Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Intergrated Circuits (Metric) - F744M - Accuris
    Accuris
Request a Quote
Description
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Intergrated Circuits (Metric)
Request a Quote

Suppliers

Company
Product
Description
Supplier Links
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Intergrated Circuits (Metric) - F744M - Accuris
Accuris
Englewood, CO, United States
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Intergrated Circuits (Metric)
F744M
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Intergrated Circuits (Metric) F744M
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Intergrated Circuits (Metric)

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Intergrated Circuits (Metric)

Buy Now

Technical Specifications

  Accuris
Product Category Standards and Technical Documents
Product Number F744M
Product Name Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Intergrated Circuits (Metric)
Unlock Full Specs
to access all available technical data

Similar Products