Accuris Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) F744M (RL)

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Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
  • Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) - F744M (RL) - Accuris
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Description
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
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Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) - F744M (RL) - Accuris
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Englewood, CO, United States
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
F744M (RL)
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) F744M (RL)
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

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Technical Specifications

  Accuris
Product Category Standards and Technical Documents
Product Number F744M (RL)
Product Name Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
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