Accuris Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) EN 60749-14

Description
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
  • Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) - EN 60749-14 - Accuris
    Accuris
Request a Quote
Description
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Request a Quote

Suppliers

Company
Product
Description
Supplier Links
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) - EN 60749-14 - Accuris
Accuris
Englewood, CO, United States
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
EN 60749-14
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) EN 60749-14
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

Buy Now

Technical Specifications

  Accuris
Product Category Standards and Technical Documents
Product Number EN 60749-14
Product Name Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Unlock Full Specs
to access all available technical data

Similar Products