Accuris Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock EN 60749-10

Description
Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock
Request a Quote
Description
Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock
Request a Quote

Suppliers

Company
Product
Description
Supplier Links
Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock - EN 60749-10 - Accuris
Englewood, CO, United States
Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock
EN 60749-10
Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock EN 60749-10
Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock

Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock

Buy Now

Technical Specifications

  Accuris
Product Category Standards and Technical Documents
Product Number EN 60749-10
Product Name Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock
Unlock Full Specs
to access all available technical data

Similar Products