Accuris Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 28: Electrostatic discharge (ESD) sensitivity testing \x96 Charged device model (CDM) \x96 Device level DSF/PREN IEC 60749-28 (DRAFT)

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Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 28: Electrostatic discharge (ESD) sensitivity testing \x96 Charged device model (CDM) \x96 Device level
  • Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 28: Electrostatic discharge (ESD) sensitivity testing \x96 Charged device model (CDM) \x96 Device level - DSF/PREN IEC 60749-28 (DRAFT) - Accuris
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Description
Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 28: Electrostatic discharge (ESD) sensitivity testing \x96 Charged device model (CDM) \x96 Device level
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Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 28: Electrostatic discharge (ESD) sensitivity testing \x96 Charged device model (CDM) \x96 Device level - DSF/PREN IEC 60749-28 (DRAFT) - Accuris
Accuris
Englewood, CO, United States
Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 28: Electrostatic discharge (ESD) sensitivity testing \x96 Charged device model (CDM) \x96 Device level
DSF/PREN IEC 60749-28 (DRAFT)
Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 28: Electrostatic discharge (ESD) sensitivity testing \x96 Charged device model (CDM) \x96 Device level DSF/PREN IEC 60749-28 (DRAFT)
Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 28: Electrostatic discharge (ESD) sensitivity testing \x96 Charged device model (CDM) \x96 Device level

Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 28: Electrostatic discharge (ESD) sensitivity testing \x96 Charged device model (CDM) \x96 Device level

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Technical Specifications

  Accuris
Product Category Standards and Technical Documents
Product Number DSF/PREN IEC 60749-28 (DRAFT)
Product Name Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 28: Electrostatic discharge (ESD) sensitivity testing \x96 Charged device model (CDM) \x96 Device level
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