Accuris Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems DS/EN 62047-11

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Semiconductor devices - Micro-electromechani cal devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechani cal systems
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Semiconductor devices - Micro-electromechani cal devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechani cal systems
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Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems - DS/EN 62047-11 - Accuris
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Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
DS/EN 62047-11
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems DS/EN 62047-11
Semiconductor devices - Micro-electromechani cal devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechani cal systems

Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems

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  Accuris
Product Category Standards and Technical Documents
Product Number DS/EN 62047-11
Product Name Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
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