Accuris Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge DS/EN 60749-40

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Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
  • Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge - DS/EN 60749-40 - Accuris
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Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
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Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge - DS/EN 60749-40 - Accuris
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Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
DS/EN 60749-40
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge DS/EN 60749-40
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

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Technical Specifications

  Accuris
Product Category Standards and Technical Documents
Product Number DS/EN 60749-40
Product Name Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
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