Accuris Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 2: Tensile testing method of thin film materials 62047-2

Description
Semiconductor devices \x96 Micro-electromechani cal devices \x96 Part 2: Tensile testing method of thin film materials
Request a Quote
Description
Semiconductor devices \x96 Micro-electromechani cal devices \x96 Part 2: Tensile testing method of thin film materials
Request a Quote

Suppliers

Company
Product
Description
Supplier Links
Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 2: Tensile testing method of thin film materials - 62047-2 - Accuris
Englewood, CO, United States
Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 2: Tensile testing method of thin film materials
62047-2
Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 2: Tensile testing method of thin film materials 62047-2
Semiconductor devices \x96 Micro-electromechani cal devices \x96 Part 2: Tensile testing method of thin film materials

Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 2: Tensile testing method of thin film materials

Buy Now

Technical Specifications

  Accuris
Product Category Standards and Technical Documents
Product Number 62047-2
Product Name Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 2: Tensile testing method of thin film materials
Unlock Full Specs
to access all available technical data

Similar Products