Accuris Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures 62047-12

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Semiconductor devices \x96 Micro-electromechani cal devices \x96 Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
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Semiconductor devices \x96 Micro-electromechani cal devices \x96 Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
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Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures - 62047-12 - Accuris
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Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
62047-12
Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures 62047-12
Semiconductor devices \x96 Micro-electromechani cal devices \x96 Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

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  Accuris
Product Category Standards and Technical Documents
Product Number 62047-12
Product Name Semiconductor devices \x96 Micro-electromechanical devices \x96 Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
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