Accuris Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing 60749-30 (REDLINE + STANDARD)

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Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
  • Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing - 60749-30 (REDLINE + STANDARD) - Accuris
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Description
Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
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Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing - 60749-30 (REDLINE + STANDARD) - Accuris
Accuris
Englewood, CO, United States
Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
60749-30 (REDLINE + STANDARD)
Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing 60749-30 (REDLINE + STANDARD)
Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

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Technical Specifications

  Accuris
Product Category Standards and Technical Documents
Product Number 60749-30 (REDLINE + STANDARD)
Product Name Semiconductor devices \x96 Mechanical and climatic test methods \x96 Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
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