Accuris Surface chemical analysis \x97 Depth profiling \x97 Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering 23170

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Surface chemical analysis \x97 Depth profiling \x97 Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
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Surface chemical analysis \x97 Depth profiling \x97 Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
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Surface chemical analysis \x97 Depth profiling \x97 Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering - 23170 - Accuris
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Surface chemical analysis \x97 Depth profiling \x97 Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
23170
Surface chemical analysis \x97 Depth profiling \x97 Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering 23170
Surface chemical analysis \x97 Depth profiling \x97 Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering

Surface chemical analysis \x97 Depth profiling \x97 Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering

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  Accuris
Product Category Standards and Technical Documents
Product Number 23170
Product Name Surface chemical analysis \x97 Depth profiling \x97 Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
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