Surface chemical analysis Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
| Accuris | |
|---|---|
| Product Category | Standards and Technical Documents |
| Product Number | 17331 |
| Product Name | Surface chemical analysis Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescenc... |
