Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
| Accuris | |
|---|---|
| Product Category | Standards and Technical Documents |
| Product Number | 16413 |
| Product Name | Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting |