The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex® silicon drift detector. The improved X-ray detection efficiency enables high-throughput and high-precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
The FT150, having a irradiation spot size of 30µm (FWHM:17µm), achieved a fluorescent X-ray intensity twice that of the conventional instrument, FT9500X. For typical application, measurement time to obtain same precision is reduced by half.
| Hitachi High Technologies America, Inc. | |
|---|---|
| Product Category | Dimensional Gages and Instruments |
| Product Number | FT150 Series |
| Product Name | High-Performance Fluorescent X-ray (XRF) Coating Thickness Gauge |
| Attribute Measurement Capability | Thickness Gage |
