Hiden Analytical 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis IG20

Description
Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling
  • 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis - IG20 - Hiden Analytical
    Hiden Analytical
Description
Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

Suppliers

Company
Product
Description
Supplier Links
5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis - IG20 - Hiden Analytical
Hiden Analytical
Livonia, MI, USA
5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis
IG20
5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis IG20
Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

Supplier's Site

Technical Specifications

  Hiden Analytical
Product Category Ion Beam Guns and Electron Beam Guns
Product Number IG20
Product Name 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis
Unlock Full Specs
to access all available technical data

Similar Products