Hiden Analytical 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis IG20

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Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

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5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis - IG20 - Hiden Analytical
Livonia, MI, USA
5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis
IG20
5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis IG20
Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

Supplier's Site

Technical Specifications

  Hiden Analytical
Product Category Ion Beam Guns and Electron Beam Guns
Product Number IG20
Product Name 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis
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