Handles from visible light to near-infrared light with one unit by equipping with a multi-wavelength laser
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
PHEMOS is a registered trademark of Hamamatsu Photonics K.K. (China, EU, Japan, Korea, Taiwan, USA).
| Hamamatsu Photonics Europe | |
|---|---|
| Product Category | Microscopes |
| Product Number | C15765-01 |
| Product Name | Semiconductor manufacturing support systems, Failure analysis system |
| Application | Semiconductor |
