The Multipoint NanoGauge Thickness measurement system C11295 is a film thickness measurement system utilizing spectral interferometry. It is designed to measure film thickness as part of the semiconductor manufacturing process, as well as for quality control of the APC and films that are mounted on semiconductor manufacturing equipment. Allows multichannel measurement in real time, which provides simultaneous multichannel measurement and multipoint measurement on film surfaces. At the same time it can also measure reflectivity (transmittance), object color, and their changes over time.
| Hamamatsu Photonics Europe | |
|---|---|
| Product Category | Dimensional Gages and Instruments |
| Product Number | C11295 |
| Product Name | Thickness measurement system |
| Measurement Scale / Units | Metric |
