GOEPEL Electronics JTAG/Boundary Scan Application

Each product life cycle is defined by the following stages: • hierarchical prototype development and validation • pilot run production and testing • field maintenance and repair of serial products. All of these stages are based on their own processes and require targetoriented applications. In essence, the foundation for high product quality is already laid in the development labs. The „V-model“ plays a significant part in controlling increasingly complex designs. It defines adequate partial verifications for each hierarchical development stage by means of specific test procedures. These verifications include: • structural tests (structural validation of the hardware) • functional tests (functional validation of the modules) • integration tests (interface validation of the modules) • system tests (functional validation of the prototype) In addition, parametric tests with firmware or hardware specifically programmed in part to optimise the prototype are typically performed in the course of these validations. This leads to a series of other procedures such as: • performance tests (optimisation of the system performance) • stress tests (optimisation of the system stability) • reconfigurations (flash/PLD/MCU programming)