Tektronix, Inc. Test Probes; Oscilloscope Probe Function Tektronix TAP2500

TEST PROBES; Oscilloscope Probe Function:Active; Bandwidth:2.5GHz; Input Voltage Max:30V; Test Probe Attenuation:10:1; For Use With:Tektronix TekVPI Probe Interface Oscilloscopes; Product Range:-; Cable Length:4.25ft RoHS Compliant: Yes

The TAP2500 is a 2.5 GHz active probe from Tektronix. Use an electrical probe to test equipment and measure currents and voltages. Probes are an integral part of any electrical power testing toolbox to ensure accurate measurements, reliability, and safety. Probes can use pulse waveforms to test components without removing them from circuits with in-circuit capabilities. Choose the probe that complements your system.

Additional Features:

• Bandwidth: 2.5 GHz
• Attenuation (probe only): 10:1
• Rise Time (probe only): <140 ps
• Input Capacitance: ≤0.8 pF
• Input Resistance: 40 kΩ
• Input Dynamic Range: –4 V to +4 V
• Input Offset Range: –10 V to +10 V
• Max Input Voltage (non-destruct): ±30 V (DC + pkAC)
• Propagation Delay: 5.3 ns
• Small Compact Probe Head for Probing Small Geometry Circuit Elements
• DUT Attachment Accessories Enable Connection to SMDs as Small as 0.5 mm Pitch
• Robust Design for Reliability
• Connects Directly to DPO7000 and DPO4000 Series Oscilloscopes Using the New TekVPI™ Probe Interface
• Provides Automatic Units Scaling and Readout on the Oscilloscopes Display
• Easy Access to Oscilloscope Probe Menu Display for Probe Status/Diagnostic Information and to Control Probe DC Offset

Applications

• Verification, Debug and Characterization of High-speed Designs
• Signal Integrity, Jitter and Timing Analysis
• Manufacturing Engineering and Test
• Signals with Voltage Swings Up to 8 Vpk-pk

With ultra-low input capacitance and a unique interface, the TAP2500 Single-ended Active FET probe provides excellent high-speed electrical and mechanical performance required for today’s digital system designs.

Specifically designed for use and direct connection to the TekVPI probe interface used on the DPO7000 and DPO4000 Series oscilloscopes, the TAP2500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems: Lower DUT loading effects with ≤0.8 pF input capacitance and 40 kΩ input resistance, versatile DUT connectivity for attaching to small SMDs, and preserves oscilloscope bandwidth at the probe tip for DPO7000 and DPO4000 Series Oscilloscope models up to 3.5 GHz

The TAP2500 is a Active Probe from Tektronix. Use an electrical probe to test equipment and measure currents and voltages. Probes are an integral part of any electrical power testing toolbox to ensure accurate measurements, reliability, and safety. Probes can use pulse waveforms to test components without removing them from circuits with in-circuit capabilities. Choose the probe that complements your system.

Additional Features:

• Lower DUT loading effects with ≤0.8 pF input capacitance and 40 kΩ input resistance
• Versatile DUT connectivity for attaching to small SMDs
• Preserves oscilloscope bandwidth at the probe tip for DPO7000 and DPO4000 Series Oscilloscope models up to 2.5 GHz
• Outstanding Electrical Performance:
• ≥2.5 GHz Probe Bandwidth
• <140 ps Rise Time
• ≤0.8 pF Input Capacitance
• 40 kΩ Input Resistance
• –4 V to +4 V Input Dynamic Range
• –10 V to +10 V DC Input Offset Range
• Max Input Voltage (Non-destruct): ±30 V (DC + pkAC)
• Small Compact Probe Head for Probing Small Geometry Circuit Elements
• DUT Attachment Accessories Enable Connection to SMDs As Small As 0.5 mm Pitch
• Robust Design for ReliabilityVersatile Mechanical Performance:

Active probes provide truer signal reproduction and fidelity for high frequency measurements. With our ultra-low input capacitance and unique interface, the TAP2500 Single-ended Active FET probe provides excellent high-speed electrical and mechanical performance required for today’s digital system designs.
Specifically designed for use and direct connection to the TekVPI™ probe interface used on the new Tektronix DPO7000 and DPO4000 Series oscilloscopes.

Test Probes Active Probe 2.5GHz w/interface