The P7330 is a Differential Probe from Tektronix. A differential probe is an active probe that has two inputs. A negative and positive input along with a ground lead that drives a 50 Ohm cable to transmit the output ot a digital oscilloscope channel.
Additional Features:
3.5 GHz Bandwidth
Applications:
Communications (Gigabit Ethernet, Fibre Channel, InfiniBand)
Semiconductor Characterization and Validation (PCI-Express, Serial ATA, IEEE 1394, USB 2.0, RAMBUS, DDR)
Disk Drive Design
Low Input Capacitance:
> 60 dB (1000:1) Common Mode Rejection Ratio (CMRR) at 1 MHz
Small Probe Head Allows Easy Probing of SMDs
The Tektronix P7330 Differential Probes enable users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications.
The Tektronix P7330 provides high-bandwidth, low circuit loading, and low noise differential probing solutions. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices.
The P7330 is a Differential Probe from Tektronix. A differential probe is an active probe that has two inputs. A negative and positive input along with a ground lead that drives a 50 Ohm cable to transmit the output ot a digital oscilloscope channel.
Additional Features:
Applications:
- Communications (Gigabit Ethernet, Fibre Channel, InfiniBand)
- Semiconductor Characterization and Validation (PCI-Express, Serial ATA, IEEE 1394, USB 2.0, RAMBUS, DDR)
- Disk Drive Design
Low Input Capacitance:
- > 60 dB (1000:1) Common Mode Rejection Ratio (CMRR) at 1 MHz
- Small Probe Head Allows Easy Probing of SMDs
The Tektronix P7330 Differential Probes enable users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications.
The Tektronix P7330 provides high-bandwidth, low circuit loading, and low noise differential probing solutions. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices.
