The P6330 is a Differential Probe from Tektronix. A differential probe is an active probe that has two inputs. A negative and positive input along with a ground lead that drives a 50 Ohm cable to transmit the output ot a digital oscilloscope channel.
Additional Features:
3.5 GHz Bandwidth
Low Input Capacitance:
> 60 dB (1000:1) Common Mode Rejection Ratio (CMRR) at 1 MHz
Small Probe Head Allows Easy Probing of SMDs
Applications:
Communications (Gigabit Ethernet, Fibre Channel, InfiniBand)
Semiconductor Characterization & Validation (PCI-Express, Serial ATA, IEEE 1394, USB 2.0, RAMBUS, DDR)
Disk Drive Design
The Tektronix P6330 enables users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications. The Tektronix P6330 provides high-bandwidth, low circuit loading, and low noise differential probing solutions.
The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices.
The P6330 is a Differential Probe from Tektronix. A differential probe is an active probe that has two inputs. A negative and positive input along with a ground lead that drives a 50 Ohm cable to transmit the output ot a digital oscilloscope channel.
Additional Features:
- 3.5 GHz Bandwidth
- Low Input Capacitance:
- > 60 dB (1000:1) Common Mode Rejection Ratio (CMRR) at 1 MHz
- Small Probe Head Allows Easy Probing of SMDs
Applications:
- Communications (Gigabit Ethernet, Fibre Channel, InfiniBand)
- Semiconductor Characterization & Validation (PCI-Express, Serial ATA, IEEE 1394, USB 2.0, RAMBUS, DDR)
- Disk Drive Design
The Tektronix P6330 enables users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications. The Tektronix P6330 provides high-bandwidth, low circuit loading, and low noise differential probing solutions.
The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices.
