The 4200-SCS/F is a semiconductor parameter analyzer from Keithley.
Features:
Flat Panel Display
Intuitive, point-and-click Windows®-based environment
Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
C-V instrument makes C-V measurements as easy as DC I-V
Pulse and pulse I-V capabilities for advanced semiconductor testing
Scope card provides integrated scope and pulse measure functionality
Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDECcompliant sample tests
Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
Includes software drivers for leading analytical probers
The Model 4200-SCS is a total system solution for electrical characterization of devices, materials and semiconductor processes. This advanced parameter analyzer provides intuitive and sophisticated capabilities for semiconductor device characterization by combining unprecedented measurement sensitivity and accuracy with an embedded Windows®-based operating system and the Keithley Interactive Test Environment. It is a powerful single box solution. The image is for reference only. See product specification for details.
The 4200-SCS/F is a semiconductor parameter analyzer from Keithley.
Features:
- Flat Panel Display
- Intuitive, point-and-click Windows®-based environment
- Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
- C-V instrument makes C-V measurements as easy as DC I-V
- Pulse and pulse I-V capabilities for advanced semiconductor testing
- Scope card provides integrated scope and pulse measure functionality
- Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
- Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
- Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDECcompliant sample tests
- Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
- Includes software drivers for leading analytical probers
The Model 4200-SCS is a total system solution for electrical characterization of devices, materials and semiconductor processes. This advanced parameter analyzer provides intuitive and sophisticated capabilities for semiconductor device characterization by combining unprecedented measurement sensitivity and accuracy with an embedded Windows®-based operating system and the Keithley Interactive Test Environment. It is a powerful single box solution.
The image is for reference only. See product specification for details.
