The 11801C is a digital oscilloscope from Tektronix.
Additional Features:
Bandwidth: DC To 50 GHz
7-ps Rise Time
Eight Channels, Expandable to 136 (with SM-11 multichannel units)
High Resolution and Measurement Repeatability
10-Femtosecond Sampling Interval (0.01 ps)
Modular Architecture
Dual-Timebase Allows Multiple Windows
FFT
Predefined Telecom Masks
True Dual-Step Differential TDR
Fully Automatic Jitter and Noise Measurements
Automatic Statistical Measurements, Histograms, and Mask Testing
Automatic Pulse Measurements with Statistics
Comprehensive Waveform Processing
Complete Programmability for ATE Applications
Color Display with Color Grading
The 11801C Digital Sampling Oscilloscope offers the widest range of on-board measurement and waveform processing capabilities of any multi-Gigahertz scope. With excellent measurement repeatability, exceptional vertical resolution, and fast display update rate, the 11801C is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages and cables, and high-speed digital data communications.
The 11801C is a digital oscilloscope from Tektronix.
Additional Features:
- Bandwidth: DC To 50 GHz
- 7-ps Rise Time
- Eight Channels, Expandable to 136 (with SM-11 multichannel units)
- High Resolution and Measurement Repeatability
- 10-Femtosecond Sampling Interval (0.01 ps)
- Modular Architecture
- Dual-Timebase Allows Multiple Windows
- FFT
- Predefined Telecom Masks
- True Dual-Step Differential TDR
- Fully Automatic Jitter and Noise Measurements
- Automatic Statistical Measurements, Histograms, and Mask Testing
- Automatic Pulse Measurements with Statistics
- Comprehensive Waveform Processing
- Complete Programmability for ATE Applications
- Color Display with Color Grading
The 11801C Digital Sampling Oscilloscope offers the widest range of on-board measurement and waveform processing capabilities of any multi-Gigahertz scope. With excellent measurement repeatability, exceptional vertical resolution, and fast display update rate, the 11801C is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages and cables, and high-speed digital data communications.
