Cypress Semiconductor Corp. Memory S29GL512S12DHE010

Description
FLASH - NOR Memory IC 512Mbit CFI 120 ns 64-FBGA (9x9)
Description
FLASH - NOR Memory IC 512Mbit CFI 120 ns 64-FBGA (9x9)
Datasheet
Datasheet Summary
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The S29GL512S12DHE010 is a 512-Mbit (64 Mbyte) NOR Flash memory device from Quarktwin Technology Ltd., utilizing 65 nm MirrorBit Eclipse technology. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range of 1.65 V to V_CC. The device supports fast page access times as low as 15 ns and random access times of 90 ns, making it suitable for high-performance embedded applications. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 256 words in a single operation. It also features automatic error checking and correction (ECC) for single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and suspend/resume commands for program and erase operations. The S29GL512S12DHE010 is rated for 100,000 program/erase cycles and offers a data retention period of 20 years. The product is available in various packaging options, including 64-ball LAA and LAE fortified BGA packages. It is suitable for industrial and automotive applications, with temperature grades ranging from -40 ¬8C to +105 ¬8C.

Datasheet Summary
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The S29GL512S12DHE010 is a 512-Mbit (64 Mbyte) NOR Flash memory device from Quarktwin Technology Ltd., utilizing 65 nm MirrorBit Eclipse technology. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range of 1.65 V to V_CC. The device supports fast page access times as low as 15 ns and random access times of 90 ns, making it suitable for high-performance embedded applications. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 256 words in a single operation. It also features automatic error checking and correction (ECC) for single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and suspend/resume commands for program and erase operations. The S29GL512S12DHE010 is rated for 100,000 program/erase cycles and offers a data retention period of 20 years. The product is available in various packaging options, including 64-ball LAA and LAE fortified BGA packages. It is suitable for industrial and automotive applications, with temperature grades ranging from -40 ¬8C to +105 ¬8C.

Suppliers

Company
Product
Description
Supplier Links
Memory - S29GL512S12DHE010 - Quarktwin Technology Ltd.
Shenzhen, Guangdong, China
FLASH - NOR Memory IC 512Mbit CFI 120 ns 64-FBGA (9x9)

FLASH - NOR Memory IC 512Mbit CFI 120 ns 64-FBGA (9x9)

Buy Now Datasheet
Shenzhen, China
Integrated Circuits (ICs) - Memory - Memory
S29GL512S12DHE010
Integrated Circuits (ICs) - Memory - Memory S29GL512S12DHE010
IC FLASH 512MBIT CFI 64FBGA

IC FLASH 512MBIT CFI 64FBGA

Supplier's Site

Technical Specifications

  Quarktwin Technology Ltd. Acme Chip Technology Co., Limited
Product Category Memory Chips Memory Chips
Product Number S29GL512S12DHE010 S29GL512S12DHE010
Product Name Memory Integrated Circuits (ICs) - Memory - Memory
Memory Category Flash; FLASH Flash; Non-Volatile
Access Time 120 ns
Operating Temperature -55 to 125 C (-67 to 257 F)
Density 512000 kbits 512000 kbits
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