The S29GL512S12DHE010 is a 512-Mbit (64 Mbyte) NOR Flash memory device from Quarktwin Technology Ltd., utilizing 65 nm MirrorBit Eclipse technology. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range of 1.65 V to V_CC. The device supports fast page access times as low as 15 ns and random access times of 90 ns, making it suitable for high-performance embedded applications. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 256 words in a single operation. It also features automatic error checking and correction (ECC) for single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and suspend/resume commands for program and erase operations. The S29GL512S12DHE010 is rated for 100,000 program/erase cycles and offers a data retention period of 20 years. The product is available in various packaging options, including 64-ball LAA and LAE fortified BGA packages. It is suitable for industrial and automotive applications, with temperature grades ranging from -40 ¬8C to +105 ¬8C.
FLASH - NOR Memory IC 512Mbit CFI 120 ns 64-FBGA (9x9)
IC FLASH 512MBIT CFI 64FBGA
| Quarktwin Technology Ltd. | Acme Chip Technology Co., Limited | |
|---|---|---|
| Product Category | Memory Chips | Memory Chips |
| Product Number | S29GL512S12DHE010 | S29GL512S12DHE010 |
| Product Name | Memory | Integrated Circuits (ICs) - Memory - Memory |
| Memory Category | Flash; FLASH | Flash; Non-Volatile |
| Access Time | 120 ns | |
| Operating Temperature | -55 to 125 C (-67 to 257 F) | |
| Density | 512000 kbits | 512000 kbits |