Cypress Semiconductor Corp. Integrated Circuits (ICs) - Memory - Memory S29GL512S12DHE010

Description
IC FLASH 512MBIT CFI 64FBGA
Description
IC FLASH 512MBIT CFI 64FBGA
Datasheet
Datasheet Summary
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The S29GL512S12DHE010 is a 512-Mbit (64 Mbyte) NOR Flash memory device from Quarktwin Technology Ltd., utilizing 65 nm MirrorBit Eclipse technology. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range of 1.65 V to V_CC. The device supports fast page access times as low as 15 ns and random access times of 90 ns, making it suitable for high-performance embedded applications. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 256 words in a single operation. It also features automatic error checking and correction (ECC) for single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and suspend/resume commands for program and erase operations. The S29GL512S12DHE010 is rated for 100,000 program/erase cycles and offers a data retention period of 20 years. The product is available in various packaging options, including 64-ball LAA and LAE fortified BGA packages. It is suitable for industrial and automotive applications, with temperature grades ranging from -40 ¬8C to +105 ¬8C.

Datasheet Summary
Powered by GS/AI

The S29GL512S12DHE010 is a 512-Mbit (64 Mbyte) NOR Flash memory device from Quarktwin Technology Ltd., utilizing 65 nm MirrorBit Eclipse technology. It operates with a single supply voltage ranging from 2.7 V to 3.6 V and features a versatile I/O voltage range of 1.65 V to V_CC. The device supports fast page access times as low as 15 ns and random access times of 90 ns, making it suitable for high-performance embedded applications. This memory device includes a 512-byte programming buffer, allowing for efficient programming of up to 256 words in a single operation. It also features automatic error checking and correction (ECC) for single-bit error correction, sector erase capabilities with uniform 128-kbyte sectors, and suspend/resume commands for program and erase operations. The S29GL512S12DHE010 is rated for 100,000 program/erase cycles and offers a data retention period of 20 years. The product is available in various packaging options, including 64-ball LAA and LAE fortified BGA packages. It is suitable for industrial and automotive applications, with temperature grades ranging from -40 ¬8C to +105 ¬8C.

Suppliers

Company
Product
Description
Supplier Links
Shenzhen, China
Integrated Circuits (ICs) - Memory - Memory
S29GL512S12DHE010
Integrated Circuits (ICs) - Memory - Memory S29GL512S12DHE010
IC FLASH 512MBIT CFI 64FBGA

IC FLASH 512MBIT CFI 64FBGA

Supplier's Site
Memory - S29GL512S12DHE010 - Quarktwin Technology Ltd.
Shenzhen, Guangdong, China
FLASH - NOR Memory IC 512Mbit CFI 120 ns 64-FBGA (9x9)

FLASH - NOR Memory IC 512Mbit CFI 120 ns 64-FBGA (9x9)

Buy Now Datasheet

Technical Specifications

  Acme Chip Technology Co., Limited Quarktwin Technology Ltd.
Product Category Memory Chips Memory Chips
Product Number S29GL512S12DHE010 S29GL512S12DHE010
Product Name Integrated Circuits (ICs) - Memory - Memory Memory
Memory Category Flash; Non-Volatile Flash; FLASH
Cycle Time 120 ns
Density 512000 kbits 512000 kbits
Supply Voltage Surface Mount 3.6V; 2.7V ~ 3.6V
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