ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.
ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.
The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.
| CSA Group | |
|---|---|
| Product Category | Standards and Technical Documents |
| Product Number | ISO/TS 10867:2010 |
| Product Name | Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy |
