CSA Group Nanotechnologies - Guidance on methods for nano- and microtribology measurements ISO/TR 11811:2012

Description
ISO/TR 11811:2012 establishes techniques for the evaluation of tribological performance of sliding contacts with a lateral size of between a few nanometres and 10 µm, and where the applied load is between 50 µN and 100 mN. It describes procedures for undertaking these measurements, and provides guidance on the effect of parameters on test results. It does not cover existing SPM techniques, such as frictional force microscopy and atomic force microscopy (AFM).
Description
ISO/TR 11811:2012 establishes techniques for the evaluation of tribological performance of sliding contacts with a lateral size of between a few nanometres and 10 µm, and where the applied load is between 50 µN and 100 mN. It describes procedures for undertaking these measurements, and provides guidance on the effect of parameters on test results. It does not cover existing SPM techniques, such as frictional force microscopy and atomic force microscopy (AFM).

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Nanotechnologies - Guidance on methods for nano- and microtribology measurements - ISO/TR 11811:2012 - CSA Group
Toronto, Ontario, Canada
Nanotechnologies - Guidance on methods for nano- and microtribology measurements
ISO/TR 11811:2012
Nanotechnologies - Guidance on methods for nano- and microtribology measurements ISO/TR 11811:2012
ISO/TR 11811:2012 establishes techniques for the evaluation of tribological performance of sliding contacts with a lateral size of between a few nanometres and 10 µm, and where the applied load is between 50 µN and 100 mN. It describes procedures for undertaking these measurements, and provides guidance on the effect of parameters on test results. It does not cover existing SPM techniques, such as frictional force microscopy and atomic force microscopy (AFM).

ISO/TR 11811:2012 establishes techniques for the evaluation of tribological performance of sliding contacts with a lateral size of between a few nanometres and 10 µm, and where the applied load is between 50 µN and 100 mN. It describes procedures for undertaking these measurements, and provides guidance on the effect of parameters on test results. It does not cover existing SPM techniques, such as frictional force microscopy and atomic force microscopy (AFM).

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  CSA Group
Product Category Standards and Technical Documents
Product Number ISO/TR 11811:2012
Product Name Nanotechnologies - Guidance on methods for nano- and microtribology measurements
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