CSA Group Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction ISO 24173:2009

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ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
  • Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction - ISO 24173:2009 - CSA Group
    CSA Group
Description
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

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Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction - ISO 24173:2009 - CSA Group
CSA Group
Toronto, Ontario, Canada
Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO 24173:2009
Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction ISO 24173:2009
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

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Technical Specifications

  CSA Group
Product Category Standards and Technical Documents
Product Number ISO 24173:2009
Product Name Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
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