CSA Group Silk - Electronic test method for defects and evenness of raw silk ISO 15625:2014

Description
ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers. It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.
Description
ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers. It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

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Silk - Electronic test method for defects and evenness of raw silk - ISO 15625:2014 - CSA Group
Toronto, Ontario, Canada
Silk - Electronic test method for defects and evenness of raw silk
ISO 15625:2014
Silk - Electronic test method for defects and evenness of raw silk ISO 15625:2014
ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers. It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.

It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

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Technical Specifications

  CSA Group
Product Category Standards and Technical Documents
Product Number ISO 15625:2014
Product Name Silk - Electronic test method for defects and evenness of raw silk
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