IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.
| CSA Group | |
|---|---|
| Product Category | Standards and Technical Documents |
| Product Number | IEC TS 62916:2017 |
| Product Name | Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing |
