CSA Group Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms IEC 62435-2:2017

Description
IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.
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Description
IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

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Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms - IEC 62435-2:2017 - CSA Group
CSA Group
Toronto, Ontario, Canada
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
IEC 62435-2:2017
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms IEC 62435-2:2017
IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

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Technical Specifications

  CSA Group
Product Category Standards and Technical Documents
Product Number IEC 62435-2:2017
Product Name Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
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