CSA Group Semiconductor devices - Hot carrier test on MOS transistors IEC 62416:2010

Description
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
  • Semiconductor devices - Hot carrier test on MOS transistors - IEC 62416:2010 - CSA Group
    CSA Group
Description
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Suppliers

Company
Product
Description
Supplier Links
Semiconductor devices - Hot carrier test on MOS transistors - IEC 62416:2010 - CSA Group
CSA Group
Toronto, Ontario, Canada
Semiconductor devices - Hot carrier test on MOS transistors
IEC 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors IEC 62416:2010
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Supplier's Site

Technical Specifications

  CSA Group
Product Category Standards and Technical Documents
Product Number IEC 62416:2010
Product Name Semiconductor devices - Hot carrier test on MOS transistors
Unlock Full Specs
to access all available technical data

Similar Products