CSA Group Semiconductor devices - Constant current electromigration test IEC 62415:2010

Description
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
  • Semiconductor devices - Constant current electromigration test - IEC 62415:2010 - CSA Group
    CSA Group
Description
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

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Semiconductor devices - Constant current electromigration test - IEC 62415:2010 - CSA Group
CSA Group
Toronto, Ontario, Canada
Semiconductor devices - Constant current electromigration test
IEC 62415:2010
Semiconductor devices - Constant current electromigration test IEC 62415:2010
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

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Technical Specifications

  CSA Group
Product Category Standards and Technical Documents
Product Number IEC 62415:2010
Product Name Semiconductor devices - Constant current electromigration test
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