IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.
| CSA Group | |
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| Product Category | Standards and Technical Documents |
| Product Number | IEC 61788-15:2011 |
| Product Name | Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies |