CSA Group Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state IEC 60749-36:2003

Description
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
  • Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state - IEC 60749-36:2003 - CSA Group
    CSA Group
Description
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state - IEC 60749-36:2003 - CSA Group
CSA Group
Toronto, Ontario, Canada
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state IEC 60749-36:2003
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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Technical Specifications

  CSA Group
Product Category Standards and Technical Documents
Product Number IEC 60749-36:2003
Product Name Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
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