CSA Group Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency IEC 60749-12:2017

Description
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.
  • Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency - IEC 60749-12:2017 - CSA Group
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Description
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency - IEC 60749-12:2017 - CSA Group
CSA Group
Toronto, Ontario, Canada
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
IEC 60749-12:2017
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency IEC 60749-12:2017
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

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Technical Specifications

  CSA Group
Product Category Standards and Technical Documents
Product Number IEC 60749-12:2017
Product Name Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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