CSA Group Semiconductor devices - Mechanical and climatic test methods - Part 1: General IEC 60749-1:2002

Description
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
  • Semiconductor devices - Mechanical and climatic test methods - Part 1: General - IEC 60749-1:2002 - CSA Group
    CSA Group
Description
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

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Semiconductor devices - Mechanical and climatic test methods - Part 1: General - IEC 60749-1:2002 - CSA Group
CSA Group
Toronto, Ontario, Canada
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General IEC 60749-1:2002
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

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Technical Specifications

  CSA Group
Product Category Standards and Technical Documents
Product Number IEC 60749-1:2002
Product Name Semiconductor devices - Mechanical and climatic test methods - Part 1: General
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