CSA Group Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units IEC 60444-7:2004

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IEC 60444-7:2004 applies to activity and frequency dips for quartz crystal units over a temperature range.
  • Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units - IEC 60444-7:2004 - CSA Group
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Description
IEC 60444-7:2004 applies to activity and frequency dips for quartz crystal units over a temperature range.

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Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units - IEC 60444-7:2004 - CSA Group
CSA Group
Toronto, Ontario, Canada
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
IEC 60444-7:2004
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units IEC 60444-7:2004
IEC 60444-7:2004 applies to activity and frequency dips for quartz crystal units over a temperature range.

IEC 60444-7:2004 applies to activity and frequency dips for quartz crystal units over a temperature range.

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Technical Specifications

  CSA Group
Product Category Standards and Technical Documents
Product Number IEC 60444-7:2004
Product Name Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
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