CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV.
Benefiting from the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design, SEM5000X can achieve further improvements in low-voltage imaging resolution. The specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch wafer size (maximum diameter 208 mm), greatly expanding applications' coverage. The advanced scanning modes and enhanced automated functions bring stronger performance and an even more optimized experience.
| CIQTEK Co., Ltd | |
|---|---|
| Product Category | Microscopes |
| Product Number | SEM5000X |
| Product Name | Ultra-high Resolution Field Emission Scanning Electron Microscope |
| Application | Metallurgical; Semiconductor |
| Grade | Benchtop; Research |
| Microscope Type | Scanning Electron Microscope |
| Features | Digital Display; Mechanical Stage |
| Remote Interface | Computer Interface; Application Software Included. |
