- Trained on our vast library of engineering resources.

CIQTEK Co., Ltd Field Emission Scanning Electron Microscope SEM4000Pro

Description
CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples. Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.
Request a Quote Datasheet

Suppliers

Company
Product
Description
Supplier Links
Field Emission Scanning Electron Microscope - SEM4000Pro - CIQTEK Co., Ltd
Hefei, Anhui,, China
Field Emission Scanning Electron Microscope
SEM4000Pro
Field Emission Scanning Electron Microscope SEM4000Pro
CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples. Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.

CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun.

With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples.

Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.

Supplier's Site Datasheet

Technical Specifications

  CIQTEK Co., Ltd
Product Category Microscopes
Product Number SEM4000Pro
Product Name Field Emission Scanning Electron Microscope
Application Metallurgical; Semiconductor
Grade Benchtop; Research
Microscope Type Scanning Electron Microscope
Features Environmental / Low Vacuum; Digital Display; Mechanical Stage
Remote Interface Computer Interface; Application Software Included.
Unlock Full Specs
to access all available technical data

Similar Products

Widefield NV Microscope -  - CIQTEK Co., Ltd
Specs
Application Biological / Life Sciences; Semiconductor
Grade Research
Microscope Type Quantitative Nondestructive Microscopic Magnetic Imaging
View Details
High-speed Scanning Electron Microscope - HEM6000 - CIQTEK Co., Ltd
Specs
Application Metallurgical; Semiconductor
Grade Research
Microscope Type Scanning Electron Microscope
View Details
Tungsten Filament Scanning Electron Microscope - SEM3200 - CIQTEK Co., Ltd
Specs
Application Metallurgical; Semiconductor
Grade Benchtop; Research
Microscope Type Scanning Electron Microscope
View Details
Ultra-high Resolution Field Emission Scanning Electron Microscope - SEM5000X - CIQTEK Co., Ltd
Specs
Application Metallurgical; Semiconductor
Grade Benchtop; Research
Microscope Type Scanning Electron Microscope
View Details